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TEM Specimen Preparation System

Ultra-low energy ion source
Concentrated ion beam
Removes amorphous and implanted layers
Ideal for post-focused ion beam processing and milling of conventionally prepared specimens
Liquid nitrogen-cooled specimen stage
Revolutionary low energy, concentrated ion beam

Fischiones Model 1040 NanoMill TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
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Ultrasonic Disk Cutter

Minimal mechanical and thermal damage
Thin specimens (>10 m) or thick (
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Plasma Cleaner

Simultaneously cleans transmission and scanning electron microscope specimens and specimen holders
Enhances imaging and analytical results
Removes existing carbonaceous contamination
Prevents contamination
No etching or sputtering
Storage in clean vacuum
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Dimpling Grinder

The Model 200 Dimpling Grinder is a state-of-the-art mechanical grinder for preparing electron microscopy samples. It is indispensable when ion milling is used for final specimen thinning. Once the specimen is prethinned by dimpling, ion milling must remove only a relatively small amount of material.
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XTEM Prep Kit

Fabricate precise cross-section specimens for transmission electron microscopy
Aligns area of interest
Produces consistent glue layer thickness
Fabricate precise XTEM specimens

The XTEM Prep Kit makes it easy to stack and bond together rectangular wafers obtained from the area of interest of the bulk material. A vise assembly holds the wafers in place while the vacuum-compatible epoxy is curing. The wafer stack is subsequently cored and sectioned into disk specimens. The XTEM Prep Kit produces specimens with a high level of mechanical integrity and a consistent glue layer thickness. The kit includes all components needed to produce high-quality, cross-section specimens.
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Specimen Grinder

For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The Model 160 Specimen Grinder is an accurate and dependable tool for mechanically prethinning specimens. It produces specimens of uniform thickness and parallel sides within minutes. During the grinding process, a graduated scale allows the specimen thickness to be controlled easily and precisely. If further thinning via dimpling is required, the platen containing the specimen is simply ejected from the specimen grinder and installed directly into the Model 200 Dimpling Grinder.
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Automatic Twin-Jet Electropolisher

Electrolytic polishing or chemical etching
Simultaneous two-sided polishing
No induced artifacts
Easily adjustable flow rate, jet and specimen positions
Reliable, accurate termination
High-quality thin foils for TEM

Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The electropolisher features easily adjustable electrolyte flow, polishing voltage, termination detection sensitivity, and jet and specimen holder positions.
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Specimen Punch

Prepare high-quality disk specimens. A precision ground punch and die plate eliminate specimen stress and distortion. For convenient handling, a spring-loaded return plunger keeps the disk specimen on the die plate surface.
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  • RYAN TRESSLER (EA FISCHIONE INSTRUMENTS)
  • 9003 CORPORATE CIRCLE EXPORT, PA 15632, United States
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