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We offer a complete product range of Keithley Parameter Analyzer, passive probes and Protocol Analyzer

Keithley Parameter Analyzer

  • Series 4200A-SCS

Keithley 4200A-SCS Parameter Analyzer Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements. Product Overview

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passive probes

Passive Probe Passive voltage probes ship standard with most oscilloscopes and provide a low cost, general purpose probing solution. Generally, these probes lack the performance of an active voltage probe but provide the ruggedness and wide dynamic range suitable for visualizing signals over a broad range of applications. Tektronix has released a new class of passive probes that redefine performance in the passive probe product category. Tektronix new class of passive probe solutions offer: Best-in-class bandwidth up to 1 GHz Best-in-class input capacitance as low as 3.9 pF which minimizes probe loading effects Best-in-class input capacitance which minimizes performance loss when long ground leads are attached Automated probe compensation eliminating the need for the compensation screwdriver

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Protocol Analyzer

  • Series TLA7SA00

The TLA7SA00 Series logic protocol analyzer modules provide an innovative approach to PCI Express validation that spans all layers of the protocol from the physical layer to the transaction layer. Feature rich software provides improved information density for viewing statistical summary and protocol analysis using innovative Transaction and Summary Profile windows. Hardware capabilities including hardware acceleration, OpenEYE, ScopePHY, and FastSYNC provide fast access to data and helps shorten the time it takes to build confidence in the test system. Powerful trigger and filtering capabilities provide the ability to quickly focus on the data of interest. A complete suite of probing solutions targeted for various form factors and applications.

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  • Stephen Miller
  • , Beaverton, United States